Noncontact AFM imaging on Al-adsorbed Si(111) surface with an empty orbital

Force interaction between an orbital of dangling bond out of an Si tip apex and an empty orbital on Al-adsorbed Si(111) surface is investigated to clarify the imaging mechanism of noncontact atomic force microscopy (AFM). Very strong contrast of noncontact AFM image is obtained. The characteristic d...

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Bibliographic Details
Published in:Applied surface science 2000-04, Vol.157 (4), p.239-243
Main Authors: Sugawara, Yasuhiro, Orisaka, Shigeki, Morita, Seizo
Format: Article
Language:English
Subjects:
Al/Si
Atomic force microscope
Atomic resolution
Condensed matter: structure, mechanical and thermal properties
Dangling bond
Empty orbital
Exact sciences and technology
Force interaction
Physics
Solid surfaces and solid-solid interfaces
Surface structure and topography
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
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Summary:Force interaction between an orbital of dangling bond out of an Si tip apex and an empty orbital on Al-adsorbed Si(111) surface is investigated to clarify the imaging mechanism of noncontact atomic force microscopy (AFM). Very strong contrast of noncontact AFM image is obtained. The characteristic discontinuity in the distance dependence of the frequency shift is also observed, which originated from chemical bonding interaction. This means that the force interaction between an orbital of dangling bond out of tip apex and an empty orbital of Al-adsorbed Si(111) surface strongly contributes to the image contrast.
ISSN:0169-4332
1873-5584
DOI:10.1016/S0169-4332(99)00533-4