X-ray photoelectron spectroscopy study of CdTe oxide films grown by rf sputtering with an Ar-NH3 plasma

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Bibliographic Details
Published in:Surface & coatings technology 2002-06, Vol.155 (1), p.16-20
Main Authors: BARTOLO-PEREZ, P, CASTRO-RODRIGUEZ, R, CABALLERO-BRIONES, F, CAUICH, W, PENA, J. L, FARIAS, M. H
Format: Article
Language:English
Subjects:
Cross-disciplinary physics: materials science
rheology
Deposition by sputtering
Exact sciences and technology
Materials science
Methods of deposition of films and coatings
film growth and epitaxy
Physics
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ISSN:0257-8972
1879-3347
DOI:10.1016/S0257-8972(02)00028-2