Investigation of ultra-thin carbon films on magnetic disks with super smooth glass substrate

This paper presents new and improved approaches used in a variety of analytical methods (AFM, TEM, XPS, TOF-SIMS, GIXR, HR-RBS, Raman, and GF-AAS) to study the properties of ultra-thin carbon films. Despite fact that a magnetic layer is covered by the thickness of 1.2 nm carbon films in the case of...

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Bibliographic Details
Published in:Tribology international 2003-04, Vol.36 (4), p.343-348
Main Authors: Tadokoro, N., Yuki, M., Miura, T., Osakabe, K.
Format: Article
Language:English
Subjects:
Applied sciences
Carbon
Corrosion
Coverage
Electronics
Exact sciences and technology
Friction, wear, lubrication
Machine components
Magnetic and optical mass memories
Magnetic Disk
Mechanical engineering. Machine design
Storage and reproduction of information
Thickness
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Summary:This paper presents new and improved approaches used in a variety of analytical methods (AFM, TEM, XPS, TOF-SIMS, GIXR, HR-RBS, Raman, and GF-AAS) to study the properties of ultra-thin carbon films. Despite fact that a magnetic layer is covered by the thickness of 1.2 nm carbon films in the case of TEM observation, the sputtered carbon films over 3 nm thick are excellent in view of the coverage and corrosion resistance. This film thickness is suitable for use with 60–100 Gbits/in 2 recording media.
ISSN:0301-679X
1879-2464
DOI:10.1016/S0301-679X(02)00208-6