Spatially resolved chemical analysis with an NSOM-based laser desorption microprobe

A new instrument for simultaneous analysis of surface topography and chemical composition has been developed. An uncoated probe of a near-field scanning optical microscope (NSOM) is used to deliver laser radiation to the sample surface. Laser-desorbed species are analyzed with a time-of-flight mass...

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Bibliographic Details
Published in:Ultramicroscopy 1998-03, Vol.71 (1), p.111-115
Main Authors: Kossakovski, D.A, O'Connor, S.D, Widmer, M, Baldeschwieler, J.D, Beauchamp, J.L
Format: Article
Language:English
Subjects:
Biological and medical applications
Exact sciences and technology
Fundamental areas of phenomenology (including applications)
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Laser spectroscopy
Mass spectrometers and related techniques
Near-field scanning optical microscopes
Optics
Physics
Scanning probe microscopes, components and techniques
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Summary:A new instrument for simultaneous analysis of surface topography and chemical composition has been developed. An uncoated probe of a near-field scanning optical microscope (NSOM) is used to deliver laser radiation to the sample surface. Laser-desorbed species are analyzed with a time-of-flight mass spectrometer (TOF MS). Both elemental and molecular analysis can be performed with simultaneous topographical imaging of the sample.
ISSN:0304-3991
1879-2723
DOI:10.1016/S0304-3991(97)00054-5