On the reliability of quantitative phase measurements by low magnification off-axis image plane electron holography

We experimentally found that the object wave function of an electron wave in a transmission electron microscope can depend on the diameter of the condenser aperture and on the excitation of the objective lens. This can be seen by low magnification holograms utilizing as sample electrically charged l...

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Bibliographic Details
Published in:Ultramicroscopy 1998-05, Vol.72 (3), p.101-107
Main Authors: Frost, B.G, Voelkl, E
Format: Article
Language:English
Subjects:
Condensed matter: structure, mechanical and thermal properties
Electron diffraction and scattering
Electron holography
Electron, positron and ion microscopes, electron diffractometers and related techniques
Exact sciences and technology
Fundamental areas of phenomenology (including applications)
Image reconstruction
tomography
Imaging and optical processing
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Optics
Physics
Structure of solids and liquids
crystallography
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Summary:We experimentally found that the object wave function of an electron wave in a transmission electron microscope can depend on the diameter of the condenser aperture and on the excitation of the objective lens. This can be seen by low magnification holograms utilizing as sample electrically charged latex spheres of different diameters, the electric field at a pn-junction and the magnetic leakage field of a magnetic memory cell.
ISSN:0304-3991
1879-2723
DOI:10.1016/S0304-3991(98)00015-1