Photoelectron diffraction study of the structures of silicon surfaces

The author witnessed the dawn of X-ray photoelectron diffraction with Chuck Fadley and has applied photoelectron diffraction to solid surfaces, particularly Si surfaces and submonolayer interfaces with it. In this article, the author reviews mainly his own photoelectron diffraction studies of silico...

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Bibliographic Details
Published in:Journal of electron spectroscopy and related phenomena 2002-10, Vol.126 (1), p.43-53
Main Author: Kono, Shozo
Format: Article
Language:English
Subjects:
Auger electron diffraction
Photoelectron diffraction
Silicon surfaces
X-ray photoelectron diffraction
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Summary:The author witnessed the dawn of X-ray photoelectron diffraction with Chuck Fadley and has applied photoelectron diffraction to solid surfaces, particularly Si surfaces and submonolayer interfaces with it. In this article, the author reviews mainly his own photoelectron diffraction studies of silicon surfaces in an attempt to define the characteristics, roles and prospects of photoelectron diffraction, Auger electron diffraction and related diffraction techniques in general.
ISSN:0368-2048
1873-2526
DOI:10.1016/S0368-2048(02)00142-1