Structure of thin films of poly(3,4-ethylenedioxythiophene)

Thin films (50–400 nm) of tosylate-doped poly(3,4-ethylene-dioxy-thiophene) (PEDOT) on various substrates have been studied by grazing incidence X-ray diffraction, using synchrotron radiation. The material was found to be highly anisotropic. This is correlated with a strong anisotropy observed in it...

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Bibliographic Details
Published in:Synthetic metals 1999-05, Vol.101 (1-3), p.561-564
Main Authors: Aasmundtveit, K.E., Samuelsen, E.J., Pettersson, L.A.A., Inganäs, O., Johansson, T., Feidenhans'l, R.
Format: Article
Language:English
Subjects:
Applied sciences
Exact sciences and technology
Low-bandgap conjugated polymers
Organic polymers
Physicochemistry of polymers
Polycrystalline thin films
Polythiophene and derivatives
Properties and characterization
Structure, morphology and analysis
X-ray diffraction
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Summary:Thin films (50–400 nm) of tosylate-doped poly(3,4-ethylene-dioxy-thiophene) (PEDOT) on various substrates have been studied by grazing incidence X-ray diffraction, using synchrotron radiation. The material was found to be highly anisotropic. This is correlated with a strong anisotropy observed in its optical and electronic properties. The crystalline order is limited, and evidence is found for a paracrystalline structure. A structural model is presented, which corroborates with the optical anisotropy. The effect of heating the material to 200 °C was studied. Unlike the situation for other substituted polythiophenes, heating PEDOT increases the crystalline order.
ISSN:0379-6779
1879-3290
DOI:10.1016/S0379-6779(98)00315-4