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Electrical and optical properties of a polymer semiconductor interface
We have fabricated a stable electrical interface between a range of n-type, p-type and undoped GaAs epitaxial layers and a film of conductive p-type polyaniline. The IV characteristics of this device show rectifying behaviour consistent with a potential barrier formed at the interface. We have used...
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Published in: | Synthetic metals 1999-06, Vol.102 (1), p.877-878 |
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Main Authors: | , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | We have fabricated a stable electrical interface between a range of n-type, p-type and undoped GaAs epitaxial layers and a film of conductive p-type polyaniline. The IV characteristics of this device show rectifying behaviour consistent with a potential barrier formed at the interface. We have used simple thermionic emission theory for a Schottky type barrier to model the results. This has shown no significant change in the barrier height as the fermi level moves through the semiconductor bandgap by changing from n-type to p-type substrates. We have measured the temperature dependence of the barrier height. Using n-type GaAs we can observe electroluminescence centred at 680 nm with a FWHM of 160 nm at a current density of 5 mA cm
−2. Our data suggests that the interface characteristics are controlled by surface states on the GaAs layer. |
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ISSN: | 0379-6779 1879-3290 |
DOI: | 10.1016/S0379-6779(98)00840-6 |