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Structural and DC electrical investigations of ZnO thin films prepared by spray pyrolysis technique
Thin films of ZnO onto glass substrate at different substrate temperatures Ts, ranging from 180°C to 450°C, have been prepared using a spray pyrolysis process. X-ray diffraction showed that the films prepared at Ts greater than 300°C exhibit the hexagonal wurtzite structure with a preferential orien...
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Published in: | Physica. B, Condensed matter Condensed matter, 2001, Vol.296 (4), p.319-325 |
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Main Authors: | , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Thin films of ZnO onto glass substrate at different substrate temperatures Ts, ranging from 180°C to 450°C, have been prepared using a spray pyrolysis process. X-ray diffraction showed that the films prepared at Ts greater than 300°C exhibit the hexagonal wurtzite structure with a preferential orientation along (002) direction. All electrical properties have been investigated for films at Ts=400°C. A relative permittivity of 9.8 is calculated from the capacitance measurements. Thermally generated electron concentration, n0=(2.8–6.7)×1010m−1, and trapping factor, θ=(8.02–18.22)×10−12 have been evaluated from the analysis of current–voltage characteristics at room temperature assuming a plausible value of carrier mobility, 1.8m2V−1s−1. The obtained values n0 and θ are correlated with the crystallite size. |
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ISSN: | 0921-4526 1873-2135 |
DOI: | 10.1016/S0921-4526(00)00571-8 |