Specular reflectivity from pyramidal surface morphologies

A model is presented for the specular reflectivity from a surface containing mounds and craters. These features are described using a pyramidal geometry that leads to a non-Gaussian distribution of terrace heights. The model is used to interpret and compare in situ synchrotron X-ray reflectivity mea...

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Bibliographic Details
Published in:Physica. B, Condensed matter Condensed matter, 2003-08, Vol.336 (1), p.130-135
Main Authors: Botez, C.E, Elliott, W.C, Li, K, Lu, E.D, Miceli, P.F, Conrad, E.H, Stephens, P.W
Format: Article
Language:English
Subjects:
Applied sciences
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Homoepitaxial growth
Metals. Metallurgy
Physics
Solid surfaces and solid-solid interfaces
Structure and morphology
thickness
Structure of solids and liquids
crystallography
Surface morphology
Surface structure and topography
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
Thin film structure and morphology
X-ray diffraction and scattering
X-ray reflectivity
X-ray reflectometry
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Summary:A model is presented for the specular reflectivity from a surface containing mounds and craters. These features are described using a pyramidal geometry that leads to a non-Gaussian distribution of terrace heights. The model is used to interpret and compare in situ synchrotron X-ray reflectivity measurements from homoepitaxially grown Cu(0 0 1), Ag(0 0 1) and Ag(1 1 1). Temperature-dependent vacancy trapping at low temperature is observed in each of these systems and it is found that the effects of surface mounds are manifested in the X-ray reflectivity for Ag(1 1 1) and Cu(0 0 1) but not for Ag(0 0 1).
ISSN:0921-4526
1873-2135
DOI:10.1016/S0921-4526(03)00281-3