Structural and magnetic properties of ion beam sputtered NiMnSb films

• Published in: Physica. B, Condensed matter Condensed matter, 1998-06, Vol.248 (1), p.140-145
• Main Authors: Schlomka, J.-P., Press, W., Fitzsimmons, M.R., Lütt, M., Grigorov, I.
• Format: Article
• Language: English
• Subjects: Condensed matter: electronic structure, electrical, magnetic, and optical properties; Condensed matter: structure, mechanical and thermal properties; Exact sciences and technology; Magnetic properties and materials; Magnetic properties of monolayers and thin films; Magnetic properties of surface, thin films and multilayers; Magneto-resistance; Physics; Structure and morphology; thickness; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties); Thin film structure and morphology; Thin films; X-ray reflectivity
• ISSN: 0921-4526; 1873-2135
• DOI: 10.1016/S0921-4526(98)00221-X

In this work the structural and magnetic properties of NiMnSb (NMS)-films deposited at different temperatures were investigated to determine optimal sample preparation conditions. Films of NMS were sputtered from a composite target onto heated (150–300°C) Si(1 0 0) and MgO(1 0 0) substrates. The crystal structure was characterized by high angle X-ray diffraction, and polycrystalline samples with the typical C1 b structure were found for higher deposition temperatures. The roughness of the growth surface was investigated by X-ray reflectivity and X-ray diffuse scattering measurements. It was found to range from 13 to 60 Å depending on the deposition temperature. Magnetization measurements confirmed ferromagnetic layers with a strong dependence of the coercive field on the deposition temperature. The saturation moments were found to be affected by deposition temperature and in all cases less than 2.5 μ B per Mn-site.