The structure and composition of mixed cationic and non-ionic surfactant layers adsorbed at the hydrophilic silicon surface

The use of specular neutron reflection to determine the structure and composition of mixed surfactant layers adsorbed at the liquid–solid interface is described. The structure of the bilayer formed at the hydrophilic silicon–aqueous solution interface by the mixed cationic/non-ionic surfactant mixtu...

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Bibliographic Details
Published in:Physica. B, Condensed matter Condensed matter, 1998-06, Vol.248 (1), p.223-228
Main Authors: Penfold, J., Staples, E.J., Tucker, I., Thompson, L.J., Thomas, R.K.
Format: Article
Language:English
Subjects:
Chemistry
Exact sciences and technology
General and physical chemistry
Hydrophilic surface
Liquid-solid interface
Mixed surfactants
Neutron reflectivity
Solid-liquid interface
Surface physical chemistry
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Summary:The use of specular neutron reflection to determine the structure and composition of mixed surfactant layers adsorbed at the liquid–solid interface is described. The structure of the bilayer formed at the hydrophilic silicon–aqueous solution interface by the mixed cationic/non-ionic surfactant mixture of hexadecyltrimethyl ammonium bromide, C 16TAB, and hexaethylene glycol monododecyl ether, C 12E 6, is described. The role of measurements using different isotopic (hydrogen/deuterium) labelling of the surfactant and solvent is highlighted, and the need to accurately characterise the native oxide layer on the surface of the silicon is discussed.
ISSN:0921-4526
1873-2135
DOI:10.1016/S0921-4526(98)00236-1