Synchrotron X-ray reflectivity study of Co/Cu multilayer structure

• Published in: Physica. B, Condensed matter Condensed matter, 1998-06, Vol.248 (1), p.395-398
• Main Authors: Tang, C.C., Telling, N.D., Langridge, S.
• Format: Article
• Language: English
• Subjects: Anomalous reflectivity; Applied sciences; Co/Cu multilayer; Condensed matter: electronic structure, electrical, magnetic, and optical properties; Condensed matter: structure, mechanical and thermal properties; Diffuse X-ray scattering; Exact sciences and technology; Interface structure and roughness; Metals. Metallurgy; Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation; Other interactions of matter with particles and radiation; Physics; Solid surfaces and solid-solid interfaces; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties); Synchrotron X-ray reflectivity; X-ray scattering
• ISSN: 0921-4526; 1873-2135
• DOI: 10.1016/S0921-4526(98)00270-1

We report on the use of Station 2.3 at the SRS Daresbury Laboratory as a high resolution reflectivity diffractometer (HRRD) for the study of interfacial structure in a Co/Cu multilayer grown using the ion-assisted deposition method. Specular, off-specular and diffuse X-ray scattering measurements were obtained from interfaces grown with concurrent ion bombardment under selected deposition conditions. The present work has successfully demonstrated that the HRRD instrument is a viable tool for the structural study of the Co/Cu system. In addition, the reflectivity results have revealed some of the growth mechanisms involved and possible conditions for the optimisation of smooth multilayer interfaces with minimal disorder.