Comparative study on the crack formations in the CeO2 buffer layers for YBCO films on textured Ni tapes and Pt tapes

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Bibliographic Details
Published in:Physica. C, Superconductivity Superconductivity, 1998-11, Vol.308 (1-2), p.91-98
Main Authors: SANGHYUN OH, JAEUN YOO, KYUHAN LEE, JUNHO KIM, YOUM, D
Format: Article
Language:English
Subjects:
Applied sciences
Electronic equipment and fabrication. Passive components, printed wiring boards, connectics
Electronics
Exact sciences and technology
Superconducting device characterization, design, and modeling
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ISSN:0921-4534
1873-2143
DOI:10.1016/s0921-4534(98)00412-2