In-situ STM studies of strain-stabilized thin-film dislocation networks under applied stress

• Published in: Materials science & engineering. A, Structural materials : properties, microstructure and processing Structural materials : properties, microstructure and processing, 2001-12, Vol.319, p.914-918
• Main Authors: Schaff, Oliver, Schmid, Andreas K., Bartelt, Norm C., de la Figuera, Juan, Hwang, Robert Q.
• Format: Article
• Language: English
• Subjects: Applied sciences; Condensed matter: structure, mechanical and thermal properties; Dislocations; Exact sciences and technology; Gold surfaces; Mechanical and acoustical properties; adhesion; Metals. Metallurgy; Physics; Solid surfaces and solid-solid interfaces; Surface dynamics; Surface elasticity; Surface phase transformation; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties); Thin films
• ISSN: 0921-5093; 1873-4936
• DOI: 10.1016/S0921-5093(01)00977-7

The effect of uniaxial applied stress on dislocation networks present in the atomic surface layer of Au(111) was studied. The measurements were made using a novel instrument combining ultrahigh vacuum scanned-probe microscopy with an in-situ stress-strain testing machine. The technique provides microscopic information, up to atomic resolution, about the large scale plasticity of surface layers under applied loads. The herringbone reconstruction of the Au(111) surface is a classic example of a strain stabilized dislocation network. We find that under 0.5% uniaxially applied compressive strain a dramatic restructuring of the network takes place. The three-fold orientational degeneracy of the system is removed and threading edge dislocations are annihilated.