Chemical sensing materials characterization by Kelvin probe technique

This paper deals first of all with an improvement of the Kelvin probe (KP) theory taking into consideration the series resistance of the input circuit. Then it illustrates a number of work function measurements performed on self-assembled monolayers interacting with varieties of analytes, and on Lan...

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Bibliographic Details
Published in:Sensors and actuators. B, Chemical Chemical, 2000-11, Vol.70 (1), p.254-262
Main Authors: D'Amico, Arnaldo, Di Natale, Corrado, Paolesse, Roberto, Mantini, Alessandro, Goletti, Claudio, Davide, Fabrizio, Filosofi, Gabriele
Format: Article
Language:English
Subjects:
Analytes
Chemical sensing materials
Input circuit
Kelvin probe technique
Langmuir–Blodgett films
Self-assembled monolayers
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Summary:This paper deals first of all with an improvement of the Kelvin probe (KP) theory taking into consideration the series resistance of the input circuit. Then it illustrates a number of work function measurements performed on self-assembled monolayers interacting with varieties of analytes, and on Langmuir–Blodgett (LB) films of porphyrins of different thickness. The output intensities of the work function have been investigated and comments are given of the results obtained. The link between the work function and thickness of material under test has been analyzed and discussed as a method for the coverage factor estimation of absorbing surfaces.
ISSN:0925-4005
1873-3077
DOI:10.1016/S0925-4005(00)00577-3