TEM study of Ni and Ni2Si ohmic contacts to SiC

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Bibliographic Details
Published in:Diamond and related materials 1997-08, Vol.6 (10), p.1428-1431
Main Authors: Pécz, B., Radnóczi, G., Cassette, S., Brylinski, C., Arnodo, C., Noblanc, O.
Format: Article
Language:English
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ISSN:0925-9635
DOI:10.1016/S0925-9635(97)00069-1