Electrical characterization of single-walled carbon nanotubes with Scanning Force Microscopy

In this work, a study of the possibilities of the Scanning Force Microscope (SFM) for studying transport properties of carbon nanotubes (CNTs) was done. Single-walled carbon nanotubes were deposited on SiO 2. Afterwards, using a mask, the surface was covered with gold, so that some of the carbon nan...

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Bibliographic Details
Published in:Materials Science & Engineering C 2001, Vol.15 (1), p.149-151
Main Authors: de Pablo, P.J., Martı́nez, M.T., Colchero, J., Gómez-Herrero, J., Maser, W.K., de Benito, A.M., Muñoz, E., Baró, A.M.
Format: Article
Language:English
Subjects:
Electrical characterization
Scanning Force Microscopy
Single-walled carbon nanotubes
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Summary:In this work, a study of the possibilities of the Scanning Force Microscope (SFM) for studying transport properties of carbon nanotubes (CNTs) was done. Single-walled carbon nanotubes were deposited on SiO 2. Afterwards, using a mask, the surface was covered with gold, so that some of the carbon nanotubes in the surface stick out underneath the gold. In those areas, topographies and electrical measurements with metallic cantilevers have been carried out. We have developed simultaneous force vs. distance and current vs. distance data along the uncovered length of the nanotubes. In addition, current vs. voltage data was acquired at the maximum loading force during the indentation process. We found that the current rises abruptly when the tip touches the carbon nanotube and it is compared with similar experiments on the gold surface by the carbon nanotube.
ISSN:0928-4931
1873-0191
DOI:10.1016/S0928-4931(01)00264-8