Specular reflectance: A convenient tool for polymer characterization by FTIR-microscopy?

Front-surface specular reflectance Fourier transform infrared (FTIR) measurements at near normal incidence are being increasingly used to study both the chemical composition and morphology of ‘optically-thick’ polymer samples. They provide a convenient, non-contact, non-destructive method of charact...

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Bibliographic Details
Published in:Micron (Oxford, England : 1993) England : 1993), 1996-10, Vol.27 (5), p.315-328
Main Authors: Chalmers, J.M., Everall, N.J., Ellison, S.
Format: Article
Language:English
Subjects:
FTIR-microscopy
polymers
specular reflectance
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Summary:Front-surface specular reflectance Fourier transform infrared (FTIR) measurements at near normal incidence are being increasingly used to study both the chemical composition and morphology of ‘optically-thick’ polymer samples. They provide a convenient, non-contact, non-destructive method of characterising, both qualitatively and quantitatively, the chemical and physical properties of thick polymer samples, or at least their surface layers. These measurements are readily made with FTIR-microscope combinations, which facilitate the easy analysis of awkwardly shaped materials or small samples, and point-by-point mapping across a sample surface. Applications of specular reflectance FTIR-microscopy to obtaining structural and morphological data on polymeric materials are illustrated and discussed in this paper.
ISSN:0968-4328
1878-4291
DOI:10.1016/S0968-4328(96)00021-2