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Enhanced visible-light photocatalytic activity of multi-elements-doped ZrO2 for degradation of indigo carmine

In this study, C,N,S-doped ZrO2 and a series of Eu doped C,N,S-ZrO2 photocatalysts were synthesized by a coprecipitation method using thiourea as the source of C, N and S and Eu(NO3)·6H2O as source of Eu. The materials were characterized by X-ray dif-fraction (XRD), Raman spectroscopy, Fourier trans...

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Bibliographic Details
Published in:Journal of rare earths 2015-05, Vol.33 (5), p.498-506
Main Authors: Agorku, E.S., Kuvarega, A.T., Mamba, B.B., Pandey, A.C., Mishra, A.K.
Format: Article
Language:English
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Summary:In this study, C,N,S-doped ZrO2 and a series of Eu doped C,N,S-ZrO2 photocatalysts were synthesized by a coprecipitation method using thiourea as the source of C, N and S and Eu(NO3)·6H2O as source of Eu. The materials were characterized by X-ray dif-fraction (XRD), Raman spectroscopy, Fourier transform infrared spectroscopy (FTIR), UV-visible diffuse reflectance spectroscopy, scanning electron microscopy (SEM)/energy dispersive X-ray spectroscopy (EDX), and transmission electron microscopy (TEM). Indigo carmine (IC) was chosen as a model for organic pollutants and used to evaluate the photocatalytic performance of the photo-catalysts under simulated solar light. Commercial ZrO2 was used as a reference material. XRD and Raman results indicated the for-mation of both tetragonal and monoclinic phase ZrO2 with particle size ranging from 8–30 nm. Multi-element doping had a great in-fluence on the optical responses manifested as red shift in the absorption edge. The highest photocatalytic activity towards IC was observed for the Eu,C,N,S-doped ZrO2 (0.6 mol.%Eu) sample (k=1.09×10–2 min–1). The commercial ZrO2 showed the lowest photo-degradation activity (k=5.83×10–4 min–1). The results showed that the control of Eu doping in the C,N,S-ZrO2 was very important in reducing electron-hole recombination. The synergistic effect of Eu, C, N, and S in the ZrO2 matrix led to enhanced utilization of simulated solar energy for the degradation of IC through narrowing of bandgaps.
ISSN:1002-0721
2509-4963
DOI:10.1016/s1002-0721(14)60447-6