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Watching at the correlation between the specific track-etch rate and the primary physical parameters of the swift ion interaction with the CR-39
Analysis of etched nuclear tracks in CR-39 solid state nuclear track detectors has recently been made possible by the confocal microscope. This recent innovation has opened up some particularly interesting perspectives. The main originality of this microscopy technique is that it makes it possible t...
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Published in: | Radiation measurements 2003-06, Vol.36 (1), p.93-98 |
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Main Authors: | , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Analysis of etched nuclear tracks in CR-39 solid state nuclear track detectors has recently been made possible by the confocal microscope. This recent innovation has opened up some particularly interesting perspectives. The main originality of this microscopy technique is that it makes it possible to work on numerical, three-dimensional images of chemically etched nuclear tracks in the CR-39. We have studied the performances of this new approach for light ions (H, He, Li and C) with kinetic energies typically of the order of the MeV per nucleus. First, we determined the response functions of the CR-39 for these ions. We were then able to show that aside from decreasing the analysis time of traditional methods, the confocal microscope greatly increases the sensibility of the detection. The aim of this study was to find a correlation between the response functions and the primary physical parameters of the interaction between the ion and the material, such as the linear energy transfer (LET), the restricted energy transfer (REL
ω0
), the integrated radial dose or the rate of ionization. Although these parameters presented a strong resemblance to the experimental response functions (they are all “Bragg” curves), none of them were correlated to the response function in an unambiguous way. |
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ISSN: | 1350-4487 1879-0925 |
DOI: | 10.1016/S1350-4487(03)00101-X |