Use of a CSLM for the analysis of chemical etched tracks in PADC

The possibility of using a confocal scanning laser microscope (CSLM) for the analysis of different parameters of α tracks in PADC was investigated. For this, PADC detectors were irradiated with α particles from an americium source under different incidence angles. The detectors were chemically etche...

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Bibliographic Details
Published in:Radiation measurements 1997, Vol.28 (1), p.845-848
Main Authors: Meesen, G., Van Oostveldt, P.
Format: Article
Language:English
Subjects:
chemical etching
confocal scanning laser microscope
Earth sciences
Earth, ocean, space
Exact sciences and technology
fluorescence
Geochronology
Isotope geochemistry. Geochronology
PADC
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Summary:The possibility of using a confocal scanning laser microscope (CSLM) for the analysis of different parameters of α tracks in PADC was investigated. For this, PADC detectors were irradiated with α particles from an americium source under different incidence angles. The detectors were chemically etched and the analysis of the etched tracks was done with a confocal scanning laser microscope under different conditions. These include reflective mode and fluorescent mode. The reflective mode showed a very low contrast. Better image quality was obtained by filling the tracks with a fluorescent solution. The CSLM is not limited to XY-scans. By changing the focal plane, Z-scans can be obtained. Depth-profiles of chemical etched tracks can be obtained with a resolution in the order of 0.5 μm.
ISSN:1350-4487
1879-0925
DOI:10.1016/S1350-4487(97)00195-9