Estimating the thickness of hydrated ultrathin poly( o-phenylenediamine) film by atomic force microscopy

• Published in: Analytica chimica acta 2004-03, Vol.505 (2), p.239-246
• Main Authors: Wu, Ching-Chou, Chang, Hsien-Chang
• Format: Article
• Language: English
• Subjects: Atomic force microscopy; Condensed matter: structure, mechanical and thermal properties; Exact sciences and technology; Force curve; Hydrated; Physics; Polymer; Structure and morphology; thickness; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties); Thickness; Thin film structure and morphology
• ISSN: 0003-2670; 1873-4324
• DOI: 10.1016/j.aca.2003.10.073

A novel method to measure ultrathin poly( o-phenylenediamine) (PPD) film electropolymerized on gold electrode in liquid was developed. It is based on the force versus distance curve (force curve) of atomic force microscopy (AFM). When 1–0.25 μm/s was chosen as the rising rate of the scanner, and 50% of the confidence interval (CI) as the qualifying threshold value, the thickness of the hydrated polymer film could be calculated. This result was compared with one obtained from an AFM image. A step-like electrode fabricated by a photolithographic process was used. The height difference of the electrode before and after the PPD coating was imaged in liquid, and then the real thickness, 19.6±5.2 nm, was obtained. The sample was also measured by estimating the transition range of the force curve of hydrated PPD film, and the thickness of the hydrated PPD film was determined to be 19.3±8.2 nm. However, the results calculated by integrating the electropolymerized charge for the oxidation process of o-phenylenediamine ( o-PD) was only one-third as large as it was when using the two previously described methods. This indicated that the structure of hydrated PPD film might have been swollen.