Loading…

Plasma dynamics and structural modifications induced by femtosecond laser pulses in quartz

► Irradiation of quartz with single fs laser pulses at increasing pulse energies. ► Ablation at high local fluences and surface depression at low fluences. ► Fs-microscopy shows that free electron plasma causes surface depression. ► Surface depression is consistent with an increased material density...

Full description

Saved in:
Bibliographic Details
Published in:Applied surface science 2012-09, Vol.258 (23), p.9389-9393
Main Authors: Hernandez-Rueda, J., Puerto, D., Siegel, J., Galvan-Sosa, M., Solis, J.
Format: Article
Language:English
Subjects:
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:► Irradiation of quartz with single fs laser pulses at increasing pulse energies. ► Ablation at high local fluences and surface depression at low fluences. ► Fs-microscopy shows that free electron plasma causes surface depression. ► Surface depression is consistent with an increased material density. ► Low steady-sate reflectivity indicates creation of defects. We have investigated plasma formation and relaxation dynamics induced by single femtosecond laser pulses at the surface of crystalline SiO2 (quartz) along with the corresponding topography modifications. The use of fs-resolved pump-probe microscopy allows combining spatial and temporal resolution and simultaneous access to phenomena occurring in adjacent regions excited with different local fluences. The results show the formation of a transient free-electron plasma ring surrounding the location of the inner ablation crater. Optical microscopy measurements reveal a 30% reflectivity decrease in this region, consistent with local amorphization. The accompanying weak depression of ≈15nm in this region is explained by gentle material removal via Coulomb explosion. Finally, we discuss the timescales of the plasma dynamics and its role in the modifications produced, by comparing the results with previous studies obtained in amorphous SiO2 (fused silica). For this purpose, we have conceived a new representation concept of time-resolved microscopy image stacks in a single graph, which allows visualizing quickly suble differences of the overall similar dynamic response of both materials.
ISSN:0169-4332
1873-5584
DOI:10.1016/j.apsusc.2011.12.020