Structural and electrical characterization of La0.72Ca0.28MnO3 ceramic and thin films

• Published in: Applied surface science 2013-01, Vol.264, p.225-228
• Main Authors: Ma, Ji, Theingi, Mya, Zhang, Hui, Ding, Xuan, Chen, Qingming
• Format: Article
• Language: English
• Subjects: Ceramic; Condensed matter: electronic structure, electrical, magnetic, and optical properties; Condensed matter: structure, mechanical and thermal properties; Cross-disciplinary physics: materials science; rheology; Exact sciences and technology; La0.72Ca0.28MnO3; Physics; Powders; Temperature coefficient of resistance; Thin films
• ISSN: 0169-4332; 1873-5584
• DOI: 10.1016/j.apsusc.2012.09.177

► La0.72Ca0.28MnO3 films were prepared on flat and 15° vicinal cut LaAlO3 substrate by pulsed laser deposition method. ► The target used was fabricated with powders synthesized through sol-gel process. ► Rocking curve and atomic force microscope images demonstrate the high crystalline quality. ► The film deposited on tilted substrate shows a more uniform grain size. ► The film deposited on tilted substrate shows a larger temperature coefficient of resistance value (11.3%). La1−xCaxMnO3 bulk ceramic with Ca content of 0.28 was sintered from nano-powders synthesized by sol–gel method. Epitaxial thin films of La0.72Ca0.28MnO3 have been prepared on both untilted and 15° vicinal cut LaAlO3 (001) substrates by pulsed laser deposition technique. The structure and surface morphology of LCMO samples (powders, target and films) were investigated by X-ray diffraction, scanning electron microscope and atom force microscope. The temperature dependence of the resistance was also studied. Large temperature coefficient of resistance value of 11.3% at 234.1K was obtained for the film grown on titled substrate.