Frequency dependence of ultrahigh dielectric constant of novel synthesized SnO₂ nanoparticles thick films

In this work, the electric and dielectric properties of nanocrystalline SnO₂ thick films were studied using ac impedance spectroscopy under different conditions through capacitance–frequency measurements in frequency range from 1Hz to 1MHz and bias voltage range from 0V to 2V. Results showed that di...

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Bibliographic Details
Published in:Current applied physics 2011-05, Vol.11 (3), p.409-413
Main Authors: Mahmoudi Chenari, H, Hassanzadeh, Ali, Golzan, M.M, Sedghi, H, Talebian, M
Format: Article
Language:English
Subjects:
dielectric properties
dielectric spectroscopy
electrical conductivity
nanocrystals
nanoparticles
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Summary:In this work, the electric and dielectric properties of nanocrystalline SnO₂ thick films were studied using ac impedance spectroscopy under different conditions through capacitance–frequency measurements in frequency range from 1Hz to 1MHz and bias voltage range from 0V to 2V. Results showed that dielectric constant (ɛ′), dielectric loss (ɛ″), loss tangent (tanδ), ac electrical conductivity (σ) and the electric modulus (M) are strongly frequency dependent. A decrease in frequency accompanied with an increase in ɛ′ and ɛ″ values. Whereas, ac electrical conductivity (σ), real (M/) and imaginary parts of electric modulus (M//) values are increased with frequency increasing. A comparative study showed that our prepared thick films have greater dielectric value than that of the reported data; hence can be used them as ultrahigh dielectric materials.
ISSN:1567-1739
1878-1675
DOI:10.1016/j.cap.2010.08.011