Infrared hemispherical reflectance of carbon nanotube mats and arrays in the 5–50 μm wavelength region

We present the absolute infrared (5–50μm) hemispherical reflectance of films produced from commercially available carbon nanotubes. Spectra were obtained with the NPL directional-hemispherical reflectance measurement facility. One group of samples consisted of mats of carbon nanotubes sprayed on cop...

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Bibliographic Details
Published in:Carbon (New York) 2012-11, Vol.50 (14), p.5348-5350
Main Authors: Chunnilall, C.J., Lehman, J.H., Theocharous, E., Sanders, A.
Format: Article
Language:English
Subjects:
Cross-disciplinary physics: materials science
rheology
Exact sciences and technology
Fullerenes and related materials
diamonds, graphite
Materials science
Physics
Specific materials
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Summary:We present the absolute infrared (5–50μm) hemispherical reflectance of films produced from commercially available carbon nanotubes. Spectra were obtained with the NPL directional-hemispherical reflectance measurement facility. One group of samples consisted of mats of carbon nanotubes sprayed on copper or silicon substrates. Another group consisted of vertically aligned carbon nanotubes grown on silicon. Two of the materials studied exhibited the lowest hemispherical reflectance so far observed in the infrared wavelength region.
ISSN:0008-6223
1873-3891
DOI:10.1016/j.carbon.2012.07.014