Controlling the thickness of carbon nanotube random network films by the estimation of the absorption coefficient

Here, we investigate the thickness of single-walled (SWCNT) and multi-walled carbon nanotube (MWCNT) random network films by angle-resolved X-ray photoemission spectroscopy. Furthermore, we estimate the absorption coefficient of carbon nanotube (CNT) films through the Lambert–Beer law, by measuring...

Full description

Saved in:
Bibliographic Details
Published in:Carbon (New York) 2015-12, Vol.95, p.28-33
Main Authors: De Nicola, Francesco, Pintossi, Chiara, Nanni, Francesca, Cacciotti, Ilaria, Scarselli, Manuela, Drera, Giovanni, Pagliara, Stefania, Sangaletti, Luigi, De Crescenzi, Maurizio, Castrucci, Paola
Format: Article
Language:English
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Here, we investigate the thickness of single-walled (SWCNT) and multi-walled carbon nanotube (MWCNT) random network films by angle-resolved X-ray photoemission spectroscopy. Furthermore, we estimate the absorption coefficient of carbon nanotube (CNT) films through the Lambert–Beer law, by measuring film optical spectra. Moreover, the knowledge of the absorption coefficient provides an easier, reliable, and faster method of investigation for generic CNT film thickness. In addition, the absorption coefficient leads to the information of the absorption length for SWCNT and MWCNT films, which is a physical quantity of fundamental interest for optoelectronic applications, such as light emitting diodes, photovoltaics, and in general light absorbers.
ISSN:0008-6223
1873-3891
DOI:10.1016/j.carbon.2015.07.096