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Diamond seed dependent luminescence properties of CVD diamond composite
Diamond-based X-ray luminescent composites are robust materials to be used in synchrotrons and free-electron lasers to detect and visualize high-intensity X-ray beams. Such composites consist of luminescent rare-earth (RE) particles embedded into an X-ray transparent diamond matrix. In this work, po...
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Published in: | Carbon (New York) 2024-03, Vol.222, p.118975, Article 118975 |
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Main Authors: | , , , , , , , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites |
Online Access: | Get full text |
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Summary: | Diamond-based X-ray luminescent composites are robust materials to be used in synchrotrons and free-electron lasers to detect and visualize high-intensity X-ray beams. Such composites consist of luminescent rare-earth (RE) particles embedded into an X-ray transparent diamond matrix. In this work, polycrystalline diamond composites with embedded particles of EuF3, SrF2:Eu and YAG:Ce were grown by microwave plasma CVD using diamond seeds with an average particle size difference of two orders of magnitude: from 5 nm up to 500 nm, with positive and negative zeta potentials. The structure, phase composition, and luminescent characteristics of the resulting composite films were investigated and analyzed. We found that various particle types can be better-suited for different composites, and the exact seeding should be selected on the case-by-case basis. The direct comparison of various diamond-based composites, grown in the identical CVD conditions but with various luminescent powders, show that YAG:Ce particles in diamond allow achieving a brighter photoluminescence (PL) in comparison to Eu-based fluorides. However, the set of fluoride powders doped with Eu3+ ions allow obtaining unusually narrow (FWHM = 0.9 nm) and intensive line near 611 nm in PL spectra, which might be better-suited for detection and characterization applications rather than a broad peak of Ce with FWHM ≈ 120 nm.
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ISSN: | 0008-6223 1873-3891 |
DOI: | 10.1016/j.carbon.2024.118975 |