In-situ growth of Cs5Cu3Cl6I2 nanocrystals within AAO arrays for X-ray imaging

• Published in: Chemical engineering journal (Lausanne, Switzerland : 1996) Switzerland : 1996), 2024-07, Vol.492, p.151908, Article 151908
• Main Authors: Bu, Weifang, Yan, Yajing, Liu, Ping, Wang, Ting, Wang, Shaoqing, Yue, Yang, Zhu, Nannan, Zhu, Xuanyu, Yang, Luyi, Mou, Dedan, Yu, Xue
• Format: Article
• Language: English
• Subjects: Array scintillation film; Indirect X-ray imaging; Lead-free halide perovskite; Light directional confinement
• ISSN: 1385-8947
• DOI: 10.1016/j.cej.2024.151908

A simple method of in-situ growth using anodized aluminum oxide templates is used to prepare a high-resolution pixelated scintillator array Cs5Cu3Cl6I2 with enhanced light direction limitation for X-ray imaging, The Cs5Cu3Cl6I2@AAO film performs excellent stability under long-term X-ray irradiation, making it a reliable option for cost-effective pixelated indirect X-ray imaging. [Display omitted] •A perovskite array scintillation film Cs5Cu3Cl6I2@AAO via an in-situ growth strategy was fabricated.•A spatial resolution of approximately 20 lp mm−1 and a detection limit of 0.152 μGy·s−1 were achieved.•Excellent stability under long-term X-ray irradiation of Cs5Cu3Cl6I2@AAO was studied. Lead-free halide perovskites have shown promising application for indirect X-ray detection as fascinating scintillator. The fabrication of pixelated scintillator films leveraging directional confinement allows high-resolution imaging, yet process complexity and the potential crystal structure damage pose challenges that compromises the corresponding scintillator performance. In this work, a facile in-situ strategy for growing scintillation perovskite of Cs5Cu3Cl6I2 within anodic aluminum oxide (AAO) membrane is developed as scintillator Cs5Cu3Cl6I2@AAO film. The as-fabricated pixelated scintillator array with an enhanced light directional confinement for high-resolution X-ray imaging is demonstrated. The corresponding film achieves a spatial resolution of approximately 20 lp mm−1 and a detection limit of 0.152 Gy·s−1. Moreover, the Cs5Cu3Cl6I2@AAO film performs excellent stability under long-term X-ray irradiation, making it a reliable option for cost-effective pixelated indirect X-ray imaging.