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Damage of lead-free solder joints in flip chip assemblies subjected to high-temperature thermal cycling
► Damage mechanism of realistic Flip Chip Solder joints (FCSJs) is investigated. ► FCSJs high-temperature reliability is modelled using Anand’s visco-plasticity. ► Very thin and very thick thicknesses of IMC impact FCSJ reliability. ► Solder strain controlled studies with strain range lower than 0.1...
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Published in: | Computational materials science 2012-12, Vol.65, p.470-484 |
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Main Authors: | , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | ► Damage mechanism of realistic Flip Chip Solder joints (FCSJs) is investigated. ► FCSJs high-temperature reliability is modelled using Anand’s visco-plasticity. ► Very thin and very thick thicknesses of IMC impact FCSJ reliability. ► Solder strain controlled studies with strain range lower than 0.12 is inadequate to simulate FCSJ’s damage. ► Accumulated FCSJ damage is dependent on percentage of IMC and solder in joint.
The damage mechanism of lead-free ball grid array (BGA) solder joints is studied whilst the magnitude of the damage was quantitatively evaluated to determine the impact of the thickness of inter-metallic compound (IMC) layer on the reliability of the joints. Five virtual test vehicle assemblies of flip chip (FC) which have 4–12μm thickness of IMC layer were subjected to the same accelerated high-temperature cycles utilising, in parts, the IEC standard 60749-25. The visco-plastic responses of the assemblies’ solder bump joints to the induced thermal load were simulated using Anand’s plasticity model. The results demonstrate that very thin and thick thickness of IMC layer impact the reliability of the FC solder joints. It was found that strain range at steady state joint damage is approximately 0.07–0.12. This finding indicates that strain controlled studies on bulk solder which are not up to these limits are inadequate to characterise damage behaviour and model damage evolution in the FC BGA solder bump joints. Further results show that the magnitude of the average accumulated visco-plastic energy density per cycle (wacc) depends on the volume percentage of solder and IMC in the joints. This dependency explains why the existing life prediction models based on wacc are not satisfactory in estimating the damage in solder joints. The authors propose the development of new prediction models which will be specific on the volume percentage of solder and IMC in the joints. |
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ISSN: | 0927-0256 1879-0801 |
DOI: | 10.1016/j.commatsci.2012.08.005 |