Model calculations of electric forces acting on carbon nanotube tip in DC-plasma sheath

Numerous ·experimental investigations indicate the necessity of negative bias for low-pressure CVD of aligned carbon nanotubes. Based on the experimentally determined electron density in the dual hot filament/DC plasma deposition system the electrical field close to the substrate was calculated. Tak...

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Bibliographic Details
Published in:Diamond and related materials 2004-03, Vol.13 (3), p.503-506
Main Authors: Blažek, J, Špatenka, P, Pácal, F, Täschner, Ch, Leonhardt, A
Format: Article
Language:English
Subjects:
Bias growth
Chemical synthesis methods
Cross-disciplinary physics: materials science
rheology
Electric field
Exact sciences and technology
Materials science
Methods of nanofabrication
Nanoscale materials and structures: fabrication and characterization
Nanotubes
Physics
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Summary:Numerous ·experimental investigations indicate the necessity of negative bias for low-pressure CVD of aligned carbon nanotubes. Based on the experimentally determined electron density in the dual hot filament/DC plasma deposition system the electrical field close to the substrate was calculated. Taking into account the field enhancement in the vicinity of the CNTs the force acting on their tips is determined. The calculated force has been found to exceed the weight of the droplet by four orders of magnitude. The computations have shown only a weak dependence between the electrical forces and the droplet shape.
ISSN:0925-9635
1879-0062
DOI:10.1016/j.diamond.2003.12.009