A low damage GaN-based light-emitting diode with textured/inclined sidewalls and an air–buffer layer

• Published in: Displays 2010-04, Vol.31 (2), p.111-114
• Main Authors: Liu, Yi-Jung, Tsai, Tsung-Yuan, Yu, Kuo-Hui, Guo, Der-Feng, Chen, Li-Yang, Tsai, Tsung-Han, Liu, Wen-Chau
• Format: Article
• Language: English
• Subjects: Applied sciences; Electronics; Exact sciences and technology; GaN; KOH; Light-emitting diode; Optoelectronic devices; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices; Wet-etching
• ISSN: 0141-9382; 1872-7387
• DOI: 10.1016/j.displa.2010.02.003

A GaN-based light-emitting diode (LED) with an air–buffer layer and textured sidewalls is fabricated and investigated. After the deposition of a 1-μm silicon dioxide (SiO 2) passivation layer on the whole device region except for the sidewall, a hot KOH etching solution is used to develop the desired textured sidewall. Many sidewalls with triangular-like shape are produced along the specific direction of 〈 1 1 ¯ 0 0 〉 , where photons introduced within multiple-quantum-well (MQW) exhibit more opportunities to scatter into the air. Based on the lateral etching, many triangular-shaped cones are formed on the patterned sapphire substrate (PSS). The device sidewall inclines with a 24° angle which results in an improved reemission of photons in the vertical/lateral direction. At 20 mA, as compared with the LED without KOH treatment, the studied device exhibits improved output power by 11.7% without deteriorating its electrical characteristics. This phenomenon can be attributed to the enhanced output light from vertical and lateral directions due to the formation of an air–buffer layer, textured and inclined sidewalls.