XPS fitting model proposed to the study of Ni and La in deactivated FCC catalysts

•Ni 2p/La 3d signal overlapping can be solved by using Shirley Background.•Ni 2p signal is strongly overlapped by La 3d in high La content FCC catalyst.•Fe 2 s signal can be neglected in normal Fe content FCC catalyst. Herein, a methodology to study the content of nickel and lanthanum by X-Ray photo...

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Bibliographic Details
Published in:Journal of electron spectroscopy and related phenomena 2019-05, Vol.233, p.5-10
Main Authors: Amaya, Álvaro A., González, Carlos A., Niño-Gómez, Martha E., Martínez O., Fernando
Format: Article
Language:English
Subjects:
Constraints for XPS data fitting
FCC catalyst
X-Ray photoelectron spectroscopy
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Summary:•Ni 2p/La 3d signal overlapping can be solved by using Shirley Background.•Ni 2p signal is strongly overlapped by La 3d in high La content FCC catalyst.•Fe 2 s signal can be neglected in normal Fe content FCC catalyst. Herein, a methodology to study the content of nickel and lanthanum by X-Ray photoelectron spectroscopy - XPS in FCC catalyst was developed. A critical problem to study the nickel in this type of material is related to the overlapping between Ni 2p3/2 and La 3d3/2 signals. In order to have an accurate and correct interpretation of XPS spectra, La 3d and Ni 2p signals were studied individually employing synthesized and FCC catalyst samples. Fitting parameters such as: background modeling method and fitting constraints were determined and tested in synthesized and FCC catalysts samples. Finally, the XPS fitting method obtained was employed to study the La 3d/Ni 2p region in FCC catalyst samples, showing a good performance to study this region.
ISSN:0368-2048
1873-2526
DOI:10.1016/j.elspec.2019.03.007