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Punch-through diodes as replacement for low-voltage Zener diodes in ESD protection circuits
We present results on a novel punch-through diode structure that provides good clamping characteristics for both positive and negative polarity. Its performance as off-chip ESD protection device is compared to that of a conventional Zener diode with a comparable capacitance; showing that a punch-thr...
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Published in: | Journal of electrostatics 2004-07, Vol.61 (3), p.149-169 |
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Main Authors: | , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | We present results on a novel punch-through diode structure that provides good clamping characteristics for both positive and negative polarity. Its performance as off-chip ESD protection device is compared to that of a conventional Zener diode with a comparable capacitance; showing that a punch-through diode features better clamping characteristics and higher current handling at a given reverse stand-off voltage. |
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ISSN: | 0304-3886 1873-5738 |
DOI: | 10.1016/j.elstat.2004.02.004 |