A study of relation between a power supply ESD and parasitic capacitance

In this study, we show that increased parasitic capacitance across lateral NPN (LNPN) devices does not necessarily enhance the electro-static discharge (ESD) robustness. Since the drain-bulk displacement current decreases, the LNPN avalanche trigger current increases and the PN junctions fail early....

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Bibliographic Details
Published in:Journal of electrostatics 2006-10, Vol.64 (11), p.760-767
Main Authors: Suzuki, Teruo, Iwahori, Junji, Morita, Teruo, Takaoka, Haruyoshi, Nomura, Toshio, Hashimoto, Kenji, Ichino, Shoji
Format: Article
Language:English
Subjects:
Electro-static discharge
Parasitic capacitance
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Summary:In this study, we show that increased parasitic capacitance across lateral NPN (LNPN) devices does not necessarily enhance the electro-static discharge (ESD) robustness. Since the drain-bulk displacement current decreases, the LNPN avalanche trigger current increases and the PN junctions fail early. In our case, this happened when the parasitic capacitance between supply lines is around several hundreds of Pico-Farads.
ISSN:0304-3886
1873-5738
DOI:10.1016/j.elstat.2006.05.007