LOT: An industrial oriented ontology engineering framework

Ontology Engineering has captured much attention during the last decades leading to the proliferation of numerous works regarding methodologies, guidelines, tools, resources, etc. including topics which are still being investigated. Even though, there are still many open questions when addressing a...

Full description

Saved in:
Bibliographic Details
Published in:Engineering applications of artificial intelligence 2022-05, Vol.111, p.104755, Article 104755
Main Authors: Poveda-Villalón, María, Fernández-Izquierdo, Alba, Fernández-López, Mariano, García-Castro, Raúl
Format: Article
Language:English
Subjects:
Collaborative ontology development
Ontology development methodology
Ontology development software support
Ontology engineering
Ontology industrial development
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Ontology Engineering has captured much attention during the last decades leading to the proliferation of numerous works regarding methodologies, guidelines, tools, resources, etc. including topics which are still being investigated. Even though, there are still many open questions when addressing a new ontology development project, regarding how to manage the overall project and articulate transitions between activities or which tasks and tools are recommended for each step. In this work we propose the Linked Open Terms (LOT) methodology, an overall and lightweight methodology for building ontologies based on existing methodologies and oriented to semantic web developments and technologies. The LOT methodology focuses on the alignment with industrial development, in addition to academic and research projects, and software development, that is making ontology development part of the software industry. This methodology includes lessons learnt from more than 20 years in ontological engineering and its application on 18 projects is reported.
ISSN:0952-1976
1873-6769
DOI:10.1016/j.engappai.2022.104755