The effect of finish layer on the interfacial cracking failure of Au Si bonding

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Bibliographic Details
Published in:Engineering failure analysis 2020-09, Vol.115, p.104682, Article 104682
Main Authors: Gao, Li-Yin, Wen, Jian, Li, Cai-Fu, Chen, Chunhuan, Liu, Zhi-Quan
Format: Article
Language:English
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ISSN:1350-6307
DOI:10.1016/j.engfailanal.2020.104682