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The effect of finish layer on the interfacial cracking failure of Au Si bonding
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Published in: | Engineering failure analysis 2020-09, Vol.115, p.104682, Article 104682 |
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container_start_page | 104682 |
container_title | Engineering failure analysis |
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creator | Gao, Li-Yin Wen, Jian Li, Cai-Fu Chen, Chunhuan Liu, Zhi-Quan |
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doi_str_mv | 10.1016/j.engfailanal.2020.104682 |
format | article |
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title | The effect of finish layer on the interfacial cracking failure of Au Si bonding |
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