Nanoscopic morphology of equilibrium thin water film near the contact line

•We obtain the equilibrium water thin film profile down to about 1nm from the substrate.•The water surface is found straight downward to the substrate.•Microscopic contact angle is found identical to the macroscopic contact angle. Evaporative triple contact lines are far from well understood, which...

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Bibliographic Details
Published in:International journal of heat and mass transfer 2015-12, Vol.91, p.1114-1118
Main Authors: Deng, Yajun, Chen, Lei, Yu, Jiapeng, Wang, Hao
Format: Article
Language:English
Subjects:
Contact line
Equilibrium
Evaporative
Partial wetting
Thin film profile
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Summary:•We obtain the equilibrium water thin film profile down to about 1nm from the substrate.•The water surface is found straight downward to the substrate.•Microscopic contact angle is found identical to the macroscopic contact angle. Evaporative triple contact lines are far from well understood, which is especially true for partial wetting. In the present work we obtain the water film profile down to about 1nm from the contact line, through a state-of-the-art tapping-mode atomic force microscopy (TM-AFM). The test section is enclosed and the measurements are conducted under equilibrium state. The results show that the liquid surface is straight downward to the substrate. The microscopic contact angle is therefore identical to the macroscopic counterpart, which greatly facilitates the thin film modeling. The linearity of the equilibrium thin films is important for the comprehensive understanding of contact line region.
ISSN:0017-9310
1879-2189
DOI:10.1016/j.ijheatmasstransfer.2015.08.057