Structural, morphological, optical, and electrical properties of In2O3 nanostructured thin films

Indium oxide (In2O3) nanostructured thin films are prepared by ultrasonic spray technique on glass substrates at 350°C. Solution flow rate influence on the structural, morphological, optical and electrical properties of these samples is then studied. A number of techniques, as well as X-ray diffract...

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Bibliographic Details
Published in:Optik (Stuttgart) 2016-09, Vol.127 (18), p.7319-7325
Main Authors: Bouhdjer, A., Saidi, H., Attaf, A., Aida, M.S., JlassI, Mohamed, Bouhaf, I., Benkhetta, Y., Bendjedidi, H.
Format: Article
Language:English
Subjects:
Flow rate
Indium oxide
Optical and electrical properties
Ultrasonic spray
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Summary:Indium oxide (In2O3) nanostructured thin films are prepared by ultrasonic spray technique on glass substrates at 350°C. Solution flow rate influence on the structural, morphological, optical and electrical properties of these samples is then studied. A number of techniques, as well as X-ray diffraction (XRD), SEM, and UV–vis are used to characterize the physical properties of these films. X-ray diffraction analysis indicates the spherical indium oxide nanoparticles (20nm to 67nm) were in single-crystalline phase with body-centered cubic structure, and the preferred growth orientation change with the change of Solution Spray Rate. The films exhibit high optical transparency >80% in the visible region. The higher value of the optical band gap was 3.93eV due to the quantum confinement effect. The film grown at 55ml/h showed low resistivity (8.510−3Ωcm).
ISSN:0030-4026
1618-1336
DOI:10.1016/j.ijleo.2016.05.035