Stability of MeV primary ion induced secondary ions

• Published in: International journal of mass spectrometry 2023-05, Vol.487, p.117037, Article 117037
• Main Authors: Jenčič, Boštjan, Vasić, Mirjana, Barba, Žiga, Kelemen, Mitja, Pelicon, Primož
• Format: Article
• Language: English
• Subjects: Ion beam analysis; Metastable ions; Secondary ion mass spectrometry; Swift heavy ions; Time-of-flight
• ISSN: 1387-3806; 1873-2798
• DOI: 10.1016/j.ijms.2023.117037

We report on the analysis of the onset and the intensity of metastable secondary ions, which are desorbed from the target material as a result of bombarding organic samples with MeV primary ions. The bimodal time-of-flight mass spectrometer, which can analyze secondary ion in linear and reflectron modes, was used for detection and characterization of such ions. The use of the bimodal mass spectrometer for this specific purpose is demonstrated on amino acid arginine, where three main fragments were detected. We have also analyzed the influence of the primary ion beam on the intensity of metastable ion signal. Results from chlorine ion beams with energies between 3 and 10 MeV have exhibited the importance of electronic sputtering on the product/precursor ion peak intensity ratio, which is significantly decreased when using primary ions with higher energy. [Display omitted] •Fragmented metastable ions from MeV-SIMS can be observed as long tails of molecular peaks in mass spectra.•Quick characterization of fragments is obtained through linear mode, and more precise identification by reflectron mode.•Fragments with intensities fragment/parent >0.01 can be detected.•Higher energy primary ion beams induce less metastable secondary ions.•Fragmentation pathways are not affected by the primary ion beam energy.