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Investigation on High Entropy Alloys as Interconnect Material for Intermediate Temperature Solid Oxide Fuel Cells
Investigation of Solid Oxide Fuel Cells (SOFCs) is receiving great attention due to its higher efficiency and zero environmental pollution during operation. Interconnects are a critical part of the SOFC stack which connects the cells in series and combines the electricity produced. The present study...
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Published in: | Journal of alloys and compounds 2023-02, Vol.935, p.168000, Article 168000 |
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Main Authors: | , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Investigation of Solid Oxide Fuel Cells (SOFCs) is receiving great attention due to its higher efficiency and zero environmental pollution during operation. Interconnects are a critical part of the SOFC stack which connects the cells in series and combines the electricity produced. The present study aims to investigate High Entropy Alloys (HEAs) for interconnect application in intermediate temperature SOFC. Towards this, FeCoCrNi, FeCoCrNiMn0.1, FeCoCrNiMn0.5, and FeCoCrNiMn HEAs are prepared by vacuum arc melting and examined for its phase evaluation. Thermal stability, thermal expansion, resistivity, oxidation, and Area Specific Resistance (ASR) are investigated up to 800 °C. Oxidation studies show the formation of multicomponent oxide in the HEAs which suppresses the growth of Cr2O3 layer. FeCoCrNiMn0.1, FeCoCrNiMn0.5, and FeCoCrNiMn HEAs possess ASR values less than 100 mΩ.cm2 in the temperature range of 600-800 °C which ensure the superior performance of the SOFC stack.
•HEAs are investigated for SOFC interconnect application for the first time.•Investigated HEAs show the formation of multicomponent oxides during oxidation.•The absence of Cr in the outer layer suppresses the formation and growth of Cr2O3 layer.•The lower ASR value of the HEAs ensures the best performance of the SOFC stack. |
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ISSN: | 0925-8388 1873-4669 |
DOI: | 10.1016/j.jallcom.2022.168000 |