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Phase field crystal study on the size and strain rate dependent evolution of Kirkendall voids in binary alloy
The evolution of Kirkendall voids in binary alloy under a uniaxial strain rate loading is investigated by the phase field crystal (PFC) model. The simulation results show that model size and the applied strain rate greatly affect the formation and growth of Kirkendall voids. It is found that the gra...
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Published in: | Journal of alloys and compounds 2024-05, Vol.983, p.173832, Article 173832 |
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Main Authors: | , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | The evolution of Kirkendall voids in binary alloy under a uniaxial strain rate loading is investigated by the phase field crystal (PFC) model. The simulation results show that model size and the applied strain rate greatly affect the formation and growth of Kirkendall voids. It is found that the grains are prone to rotate when the model size is smaller than 34.7a×34.7a (a is the lattice constant) and the initially set grain boundaries will disappear after relaxation, no Kirkendall voids form in this case. As the model size increases, Kirkendall voids arise and interconnect with each other, and large voids will dissociate to produce small voids. Moreover, the applied strain rate also affects the formation and growth path of Kirkendall voids. Voids only form at the grain boundaries in the absence of strain rate loading, whereas voids form both inside the grains and at the grain boundaries under strain rate loading. The growth of voids can easily form oblique structures caused by dislocation slip, and they tend to grow perpendicular to the direction of applied strain rate.
•A minimum model size for Kirkendall effect analysis is obtained by PFC simulation.•The formation mechanism of Kirkendall voids under strain rate loading are revealed.•The growth of Kirkendall voids tends to be perpendicular to the loading direction. |
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ISSN: | 0925-8388 1873-4669 |
DOI: | 10.1016/j.jallcom.2024.173832 |