Comparison of the luminescent properties of Lu3Al5O12:Pr crystals and films under synchrotron radiation excitation

• Published in: Journal of luminescence 2016-11, Vol.179, p.496-500
• Main Authors: Zorenko, Yu, Gorbenko, V., Zorenko, T., Voznyak, T., Nizankovskiy, S.
• Format: Article
• Language: English
• Subjects: LuAG; Luminescence; Pr dopant; Single crystal; Single crystalline film; Synchrotron radiation
• ISSN: 0022-2313; 1872-7883
• DOI: 10.1016/j.jlumin.2016.07.053

The work is dedicated to comparative investigation of the luminescent properties of Lu3Al5O12:Pr(LuAG:Pr) single crystals and single crystalline films using excitation by synchrotron radiation with an energy of 3.7–25eV in the exciton range of LuAG host. We have found that the differences in the excitation spectra and luminescence decay kinetics of LuAG:Pr crystals and films are caused by involving the LuAl antisite defects and oxygen vacancies in the crystals and Pb2+ flux related dopants in the films in the excitation processes of the Pr3+ luminescence. Taking into account these differences, we have determined the energy structure of the Pr3+ ions in LuAG host and estimated the differences in the energies of creation of excitons bound with the isolated Pr3+ ions in LuAG:Pr films and the dipole Pr–LuAl antisite defect centers in the crystal counterpart. •Comparison of the luminescent properties of LuAG:Pr single crystals and films.•Superposition of the Pr3+ and defect centers luminescence of LuAG:Pr crystal.•Different creation energies of an excitons bound with the Pr3+ in LuAG:Pr crystals and films.•More faster decay kinetics of the Pr3+ luminescence in LuAG:Pr films.•Low content of slow emission component in LuAG:Pr films.