Reducing the critical switching current in the free layer of magnetic random access memory

The switching behavior of synthetic antiferromagnetic (SyAF) bilayers in a toggle magnetic random access memory is investigated by micromagnetism. The strength of exchange coupling between the two sublayers significantly modifies the switching behavior of SyAF bilayers. The critical switching curren...

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Bibliographic Details
Published in:Journal of magnetism and magnetic materials 2006-09, Vol.304 (1), p.e288-e290
Main Authors: Yang, Jyh-Shinn, Chang, Ching-Ray
Format: Article
Language:English
Subjects:
Micromagnetic simulation
MRAM
Synthetic antiferromatic bilayer
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Summary:The switching behavior of synthetic antiferromagnetic (SyAF) bilayers in a toggle magnetic random access memory is investigated by micromagnetism. The strength of exchange coupling between the two sublayers significantly modifies the switching behavior of SyAF bilayers. The critical switching current decreases with decreasing the exchange coupling, and the low critical switching current can be achieved for SyAF bilayers solely based on the magnetostatic coupling. In addition, the optimization of the end shape in free layers and the ratio of width to height of conducting lines can further reduce the critical switching current.
ISSN:0304-8853
DOI:10.1016/j.jmmm.2006.02.022