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Influence of total film thickness on high-frequency magnetic properties of the [FeCoSiN/SiNx]n multilayer thin films
[FeCoSiN/SiNx]n multilayer thin films with different number of layers were fabricated by alternating magnetron sputtering at room temperature with no external magnetic field applied on substrates. A well-defined laminated structure consisting of 7nm FeCoSiN magnetic layer and 2nm SiNx insulating lay...
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Published in: | Journal of magnetism and magnetic materials 2015-01, Vol.374, p.85-91 |
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Main Authors: | , , , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | [FeCoSiN/SiNx]n multilayer thin films with different number of layers were fabricated by alternating magnetron sputtering at room temperature with no external magnetic field applied on substrates. A well-defined laminated structure consisting of 7nm FeCoSiN magnetic layer and 2nm SiNx insulating layer was observed by transmission electron microscopy (TEM). The static magnetic hysteresis loops of the [FeCoSiN/SiNx]n multilayer thin films measured by vibrating sample magnetometer (VSM) presented an obvious in-plane uniaxial magnetic anisotropy. The dynamic magnetic performance of the [FeCoSiN/SiNx]n multilayer films was studied by vector network analyzer and LLG equation. The results indicated that the total film thickness has slightly impact on the high-frequency magnetic performance of the multilayer thin films. When the total thickness of the [FeCoSiN/SiNx]n multilayer thin films increased to micron level, they could still maintain encouraging high-frequency magnetic properties and electrical property: the ferromagnetic resonance frequency fr=3.74GHz, real permeability µ′=93.73, and electrical resistivity ρ=196µΩcm.
•The [FeCoSiN/SiNx]n multilayer thin films were prepared by magnetron sputtering.•The influence of total film thickness on high-frequency properties was studied.•The multilayer thin films exhibited excellent high-frequency properties. |
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ISSN: | 0304-8853 |
DOI: | 10.1016/j.jmmm.2014.08.028 |