Single and multilayer porous silicon structures for photonic applications

Porous silicon (PS) apart from its diverse properties from bulk Si is also identified to be a photonic material. PS single and multilayer samples are prepared on a polished surface of (100) Si substrate. A peak fitting technique has been discussed for XRD analysis in the case of a dichromatic beam....

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Bibliographic Details
Published in:Journal of non-crystalline solids 2008-05, Vol.354 (19-25), p.2544-2547
Main Authors: Anto Pradeep, J., Gogoi, Purabi, Agarwal, Pratima
Format: Article
Language:English
Subjects:
Cross-disciplinary physics: materials science
rheology
Exact sciences and technology
Materials science
Nanocrystalline materials
Nanocrystals
Nanoscale materials and structures: fabrication and characterization
Photonic bandgap
Physics
Porosity
X-ray diffraction
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Summary:Porous silicon (PS) apart from its diverse properties from bulk Si is also identified to be a photonic material. PS single and multilayer samples are prepared on a polished surface of (100) Si substrate. A peak fitting technique has been discussed for XRD analysis in the case of a dichromatic beam. Theoretical simulations of light transmission for some special structures are also presented.
ISSN:0022-3093
1873-4812
DOI:10.1016/j.jnoncrysol.2007.09.092