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Broad UHF ferromagnetic resonance of iron rich-aluminum pulsed laser deposited thin films

The magnetic susceptibility of Fe–Al off-normal pulsed laser deposited thin films was measured at ultra high frequencies, UHF. Different Fe 1− x –Al x films from pure Fe to x = 0.2 Al were prepared. The films were ≈40 nm thick and non-crystalline peaks were detected by the X-ray diffractometry studi...

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Bibliographic Details
Published in:Journal of non-crystalline solids 2008-12, Vol.354 (47), p.5198-5200
Main Authors: Madurga, V., Vergara, J., Favieres, C.
Format: Article
Language:English
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Summary:The magnetic susceptibility of Fe–Al off-normal pulsed laser deposited thin films was measured at ultra high frequencies, UHF. Different Fe 1− x –Al x films from pure Fe to x = 0.2 Al were prepared. The films were ≈40 nm thick and non-crystalline peaks were detected by the X-ray diffractometry studies. The magnetization of the films remained between 2.0 and 1.8 T for composition less than or equal to 20% Al. A magnetic anisotropy, from H k ≈ 18 Oe for pure Fe to H k ≈ 130 Oe for 20% Al was measured. These samples exhibited a well-defined ferromagnetic resonance at frequencies between ≈2.0 GHz and 3.8 GHz depending on composition. The broad resonance peaks had a width, at half maximum, w h, in the interval from 2.5 GHz to 4.0 GHz depending on Al content. After fitting the magnetic hysteresis loops using a simple distribution of anisotropy values, we used the Landau–Lifshitz–Gilbert equation to fit the UHF magnetic susceptibility. From this last fit we obtained a high damping coefficient value (≈4 times higher than that corresponding to Co or CoFe films), explaining this broad ferromagnetic resonance of these Fe 1− x –Al x films.
ISSN:0022-3093
1873-4812
DOI:10.1016/j.jnoncrysol.2008.07.041