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Effect of Silane flow rate on microstructure of Silicon films deposited by HWCVD
Hydrogenated silicon films ranging from pure amorphous to those containing small crystallites in large crystalline fraction are prepared using the HWCVD technique without using any hydrogen dilution which is supposed to be necessary for the deposition of nanocrystalline Si films. The only parameter...
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Published in: | Journal of non-crystalline solids 2012-09, Vol.358 (17), p.1990-1994 |
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Main Authors: | , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Hydrogenated silicon films ranging from pure amorphous to those containing small crystallites in large crystalline fraction are prepared using the HWCVD technique without using any hydrogen dilution which is supposed to be necessary for the deposition of nanocrystalline Si films. The only parameter that is varied is Silane flow rate. The deposition rate ranges from 6–27Å/s. The band gap of the films (1.8–2.0eV) is high compared to the regular films, which is attributed to the improved short and medium range order as well as the presence of low density amorphous tissues in the grain boundary regions. The films show improved stability under long term light exposure due to more ordered structure and presence of hydrogen mostly as strong Si―H bonds.
► Hydrogenated silicon films from pure amorphous to nanocrystalline are prepared. ► Films are prepared without any hydrogen dilution. ► The only parameter that is varied is Silane flow rate. ► High deposition rate ~10–27Å/s is achieved for the films. ► Films contain less amount of hydrogen and mostly bonded in monohydride mode. |
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ISSN: | 0022-3093 1873-4812 |
DOI: | 10.1016/j.jnoncrysol.2011.12.095 |